Singapore, Singapore

Sung Woon Choo

This inventor holds 2 USPTO granted patents. Top assignees: Chartered Semiconductor Manufacturing Ltd (Corporation), Globalfoundries Singapore Pte. Ltd.. Active years: 2008-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sung Woon Choo. Retrieved from https://idiyas.com/inventor/sung-woon-choo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2008-2012

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2 patents (USPTO):Explore Patents

Title: Innovations of Sung Woon Choo

Introduction

Sung Woon Choo is a notable inventor based in Singapore, recognized for his contributions to optical sensor technology. With a total of 2 patents, he has made significant strides in the field of optical color sensing.

Latest Patents

One of his latest patents is an optical color sensor system. This system includes a substrate with an optical sensor and a passivation layer formed over the substrate. The passivation layer is then planarized, and color filters are created over it. A planar transparent layer is placed over the color filters, and microlenses are formed on this layer, enhancing the sensor's capabilities.

Career Highlights

Sung Woon Choo has worked with prominent companies in the semiconductor industry, including Chartered Semiconductor Manufacturing Ltd and Globalfoundries Singapore Pte. Ltd. His experience in these organizations has contributed to his expertise in optical technologies.

Collaborations

Some of his notable coworkers include Guy Eristoff and Kian Siong Ang, who have collaborated with him on various projects.

Conclusion

Sung Woon Choo's innovative work in optical sensor systems showcases his significant impact on technology. His patents reflect a commitment to advancing the field and improving sensor capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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