Gunpo, South Korea

Sung Chul Moon

This inventor holds 4 USPTO granted patents and 5 published patent applications. Top assignee: Ateco Inc.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sung Chul Moon. Retrieved from https://idiyas.com/inventor/sung-chul-moon-5hmj33k0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 25.0

Average Co-Inventor Count = 4.6

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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4 patents (USPTO):Explore Patents

Title: Innovations by Sung Chul Moon

Introduction

Sung Chul Moon is a notable inventor based in Gunpo-si, South Korea. He has made significant contributions to the field of device performance testing. His innovative approach has led to the development of a unique system that enhances the reliability of devices under temperature load tests.

Latest Patents

Sung Chul Moon holds a patent for a "System for testing performance of device in temperature load test." This system includes a tester with multiple sockets that can make electrical contact with various devices. It features a pusher that facilitates the insertion of devices into the sockets. Additionally, the system incorporates two temperature regulators that maintain specific temperature ranges during testing, ensuring accurate performance evaluations.

Career Highlights

Sung Chul Moon is currently associated with Ateco Inc., where he applies his expertise in device testing. His work has been instrumental in advancing testing methodologies, contributing to improved device performance and reliability.

Collaborations

He collaborates with talented coworkers, including Taek Seon Lee and Ho Nam Kim, who share his commitment to innovation and excellence in their respective fields.

Conclusion

Sung Chul Moon's contributions to device performance testing exemplify the impact of innovative thinking in technology. His patented system represents a significant advancement in ensuring device reliability under varying temperature conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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