The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jun. 18, 2024
Applicant:

Ateco Inc., Gunpo-si, KR;

Inventors:

Taek Seon Lee, Hwaseong-si, KR;

Ho Nam Kim, Seongnam-si, KR;

Sung Chul Moon, Gunpo-si, KR;

Han Su Bae, Siheung-si, KR;

Ju Hyun Kim, Suwon-si, KR;

Assignee:

ATECO INC., Gunpo-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2893 (2013.01); G01R 1/0466 (2013.01); G01R 31/2601 (2013.01); G01R 31/2863 (2013.01);
Abstract

Disclosed is a test for a semiconductor device, including: a test board that has a preparation surface on which a test tray with the semiconductor device mounted to an insert is prepared, and performs a test on the semiconductor device mounted to the insert; and a pressing unit that is positioned to face the preparation surface and presses the insert of the test tray prepared on the preparation surface toward the test board.


Find Patent Forward Citations

Lee, Taek. (2026). Test tray for semiconductor devices and test apparatus using the same (U.S. Patent No. 12699130). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12699130

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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