The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Jun. 18, 2024
Applicant:
Ateco Inc., Gunpo-si, KR;
Inventors:
Taek Seon Lee, Hwaseong-si, KR;
Ho Nam Kim, Seongnam-si, KR;
Sung Chul Moon, Gunpo-si, KR;
Han Su Bae, Siheung-si, KR;
Ju Hyun Kim, Suwon-si, KR;
Assignee:
ATECO INC., Gunpo-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2601 (2013.01);
Abstract
Disclosed is a test tray to which a semiconductor device is mounted according to an embodiment of the disclosure, the test tray including: a plurality of inserts to which the semiconductor devices are mounted; and a frame which supports the inserts in arrangement respectively corresponding to sockets of a test apparatus and has a length in a first axis and a width in a second axis.
Lee, Taek. (2026). Test tray for semiconductor devices and test apparatus using the same (U.S. Patent No. 12754227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754227
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile