Sundar V Pathy

Title: The Innovations of Sundar V Pathy

Introduction

Sundar V Pathy is an accomplished inventor based in Chandler, AZ. He holds two patents that showcase his expertise in developing advanced testing tools and methodologies. His work has significantly contributed to the field of test instrumentation and field programmable gate arrays.

Latest Patents

One of Sundar's latest patents is a "Debug tool for test instruments coupled to a device under test." This invention involves receiving a plurality of data captured by various test instruments connected to a device under test. The captured data elements are associated with timestamps, allowing for detailed analysis and graphical display of the data to users. Another notable patent is for "Compressed test patterns for a field programmable gate array." This invention focuses on compressing test patterns onto a field programmable gate array to efficiently test devices under test. It includes identifying values for drive and compare pins across multiple test cycles, analyzing these values, and storing the compressed data on the FPGA.

Career Highlights

Sundar has had a notable career, working with prominent companies such as Intel Corporation. His experience in the tech industry has allowed him to develop innovative solutions that enhance testing processes and improve device performance.

Collaborations

Sundar has collaborated with talented individuals such as James Edward Neeb and Shelby G Rollins. These partnerships have fostered a creative environment that has led to significant advancements in their respective fields.

Conclusion

Sundar V Pathy is a remarkable inventor whose contributions to test instrumentation and field programmable gate arrays have made a lasting impact. His innovative patents and collaborations reflect his dedication to advancing technology and improving testing methodologies.