Company Filing History:
Years Active: 2011-2014
Title: Innovations of Sundar Jawaharlal
Introduction
Sundar Jawaharlal is an accomplished inventor based in Glen Allen, VA (US). He has made significant contributions to the field of technology, particularly in the area of defect analysis and yield prediction. With a total of three patents to his name, Sundar has demonstrated his expertise and innovative thinking.
Latest Patents
Sundar's latest patents include "Inline defect analysis for sampling and SPC" and "Stage yield prediction." The inline defect analysis method involves receiving geometric characteristics of individual defects and design data corresponding to those defects. This method determines which defects are likely to be nuisance defects and refrains from sampling them. The stage yield prediction method focuses on predicting yield during the design stage by analyzing defectivity data from previous wafer designs. It divides defects into systematic and random categories, predicting yield separately for each and calculating a combined yield.
Career Highlights
Sundar Jawaharlal works at Applied Materials, Inc., a leading company in the field of materials engineering. His work has been instrumental in advancing technologies that improve manufacturing processes and product quality. His innovative approaches have garnered attention and respect within the industry.
Collaborations
Sundar collaborates with talented individuals such as Rinat Shimshi and Youval Nehmadi. Their teamwork has contributed to the successful development of innovative solutions in their field.
Conclusion
Sundar Jawaharlal is a notable inventor whose work in defect analysis and yield prediction has made a significant impact in technology. His contributions continue to influence advancements in manufacturing processes.