This inventor holds 1 USPTO granted patent. Top assignee: Eo Technics Co., Ltd. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Sun Jung Kim: Innovator in Wafer Dicing Technology
Introduction
Sun Jung Kim is a notable inventor based in Gunpo, South Korea. She has made significant contributions to the field of semiconductor manufacturing, particularly in the area of wafer dicing technology. Her innovative approach has led to the development of a unique marking method that enhances the efficiency of wafer processing.
Latest Patents
Sun Jung Kim holds a patent for a "Marking method for wafer dice." This patent discloses a method for marking a plurality of wafer dice that have been divided through a wafer dicing process. The method involves several steps, including setting multiple scan regions on the wafer, scanning these regions using a line scan camera, and collecting position information for each wafer die. The process culminates in marking each wafer die with a laser marker based on the collected position data. This innovation streamlines the marking process and improves accuracy in semiconductor manufacturing.
Career Highlights
Sun Jung Kim is currently employed at Eo Technics Co., Ltd., where she continues to develop cutting-edge technologies in the semiconductor industry. Her work has been instrumental in advancing the methods used in wafer processing, contributing to the overall efficiency and effectiveness of manufacturing processes.
Collaborations
Sun Jung Kim collaborates with talented colleagues, including Jae Man Choi and Sung Beom Jung. These partnerships foster a creative environment that encourages innovation and the sharing of ideas, further enhancing the development of new technologies.
Conclusion
Sun Jung Kim's contributions to wafer dicing technology exemplify her commitment to innovation in the semiconductor industry. Her patented marking method represents a significant advancement in the field, showcasing her expertise and dedication to improving manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile