Santa Barbara, CA, United States of America

Steven Nagle

This inventor holds 3 USPTO granted patents and 2 EPO patents. Top assignees: Veeco Instruments Inc., Bruker Nano Gmbh. Active years: 2010-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steven Nagle. Retrieved from https://idiyas.com/inventor/steven-nagle-wuep2bv6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 76(Granted Patents)


Company Filing History:


Years Active: 2010-2013

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3 patents (USPTO):Explore Patents

Title: Steven Nagle: Pioneering Innovations in Metrology Technology

Introduction:

Steven Nagle, a visionary inventor from Santa Barbara, CA, USA, has made significant contributions to the field of metrology technology through his groundbreaking inventions. With a total of 3 patents to his name, Nagle continues to push the boundaries of technology and innovation, leaving a lasting legacy in the world of inventions.

Latest Patents:

1. Method of fabricating a probe device for a metrology instrument and a probe device produced thereby: This patent involves a method for producing a probe device for a metrology instrument, specifically for atomic force microscopy (AFM). By utilizing FIB milling, Nagle has developed a high aspect ratio tip suitable for deep trench AFM in less than one minute, revolutionizing the process of probe device fabrication.

2. Probe device for a metrology instrument and method of fabricating the same: This patent focuses on the production of probe devices for metrology instruments, such as AFM, with sharp tips and short cantilevers. Through precise etching techniques, Nagle has achieved fundamental resonant frequencies greater than 700 kHz, enhancing the performance of these instruments.

Career Highlights:

Steven Nagle has worked with prominent companies in the industry, including Veeco Instruments Inc. and Bruker Nano GmbH, where he honed his skills and pioneered innovative solutions in metrology technology. His expertise and dedication have been instrumental in driving advancements in the field.

Collaborations:

Throughout his career, Nagle has collaborated with top experts in the field, such as Wenjun Fan and Craig Prater. These collaborations have led to the development of cutting-edge technologies and have cemented Nagle's reputation as a visionary inventor in the metrology industry.

Conclusion:

Steven Nagle's passion for innovation and his relentless pursuit of solutions for complex problems have established him as a true trailblazer in the world of inventions. His patents and collaborations underscore his commitment to pushing the boundaries of technology and leaving a lasting impact on the field of metrology. Nagle's legacy continues to inspire future generations of inventors to strive for excellence and transformative breakthroughs in the realm of innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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