Company Filing History:
Years Active: 2007-2017
Title: The Innovations of Steven J Ray
Introduction
Steven J Ray is an accomplished inventor based in Bloomington, IN (US). He holds a total of 6 patents that showcase his expertise in the field of electronic components and analytical methods. His work has significantly contributed to the identification and analysis of counterfeit electronic components.
Latest Patents
One of his latest patents is titled "Ambient sampling mass spectrometry and chemometric analysis for screening encapsulated electronic and electrical components for counterfeits." This invention provides a method and apparatus for identifying counterfeit electronic components by subjecting them to an analytical method of ambient surface analysis. The process involves desorbing and ionizing compounds directly from the surface of the suspected counterfeit without any pretreatment. The resultant ions are detected, compared to known standards, and a confidence level is returned regarding the authenticity of the component.
Another notable patent is the "Combined distance-of-flight and time-of-flight mass spectrometer." This instrument integrates distance-of-flight mass spectrometry (DOFMS) and time-of-flight mass spectrometry (TOFMS). It features an ion source that produces ions with varying mass-to-charge ratios, along with two detectors that measure the travel distance and time of the ions, enhancing the accuracy of mass spectrometry.
Career Highlights
Throughout his career, Steven has worked with prestigious organizations such as Indiana University and Battelle Memorial Institute. His contributions to these institutions have been instrumental in advancing research and development in the field of electronic components.
Collaborations
Steven has collaborated with notable colleagues, including Gary M Hieftje and Jacob T Shelley. Their combined expertise has fostered innovation and progress in their respective fields.
Conclusion
Steven J Ray's contributions to the field of electronic component analysis and counterfeit detection are significant. His innovative patents and collaborations reflect his dedication to advancing technology and ensuring the integrity of electronic components.
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