The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Apr. 05, 2011
Christie G. Enke, Placitas, NM (US);
Steven J. Ray, Bloomington, IN (US);
Alexander W. Graham, Bloomington, IN (US);
Gary M. Hieftje, Bloomington, IN (US);
Elise Dennis, Bloomington, IN (US);
Charles J. Barinaga, West Richland, WA (US);
David W. Koppenaal, Richland, WA (US);
Christie G. Enke, Placitas, NM (US);
Steven J. Ray, Bloomington, IN (US);
Alexander W. Graham, Bloomington, IN (US);
Gary M. Hieftje, Bloomington, IN (US);
Elise Dennis, Bloomington, IN (US);
Charles J. Barinaga, West Richland, WA (US);
David W. Koppenaal, Richland, WA (US);
Indiana University Research and Technology Corporation, Indianapolis, IN (US);
Battelle Memorial Institute, Richland, WA (US);
Abstract
Novel methods and instrumentation for mass spectrometry are described. Zoom-time of flight mass spectrometry (Zoom-TOF) allows increased mass resolution over a pre-determined specific range of masses. Methods for retrofitting traditional time-of-flight (TOF) and distance of flight (DOF) mass spectrometers are described, as well as novel instruments capable of performing Zoom-TOF analyses.