The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2014
Filed:
May. 03, 2011
Christie G. Enke, Placitas, NM (US);
Steven J. Ray, Bloomington, IN (US);
Alexander W. Graham, Bloomington, IN (US);
Gary M. Hieftje, Bloomington, IN (US);
Charles J. Barinaga, West Richland, WA (US);
David W. Koppenaal, Richland, WA (US);
Christie G. Enke, Placitas, NM (US);
Steven J. Ray, Bloomington, IN (US);
Alexander W. Graham, Bloomington, IN (US);
Gary M. Hieftje, Bloomington, IN (US);
Charles J. Barinaga, West Richland, WA (US);
David W. Koppenaal, Richland, WA (US);
Other;
Abstract
A combined distance-of-flight mass spectrometry (DOFMS) and time-of-flight mass spectrometry (TOFMS) instrument includes an ion source configured to produce ions having varying mass-to-charge ratios, a first detector configured to determine when each of the ions travels a predetermined distance, a second detector configured to determine how far each of the ions travels in a predetermined time, and a detector extraction region operable to direct portions of the ions either to the first detector or to the second detector.