Indiana University

Other

Battelle Memorial Institute

Steven J Ray

Gary M Hieftje

Jacob T Shelley

Charles J Barinaga

Christie Enke

David W Koppenaal

Francisco J Andrade

Alexander W Graham

Norris J Caldwell

Michael R Webb

Elise Dennis

William C Wetzel

Kevin P Pfeuffer

Gerardo Gamez

A method and apparatus for identification of a counterfeit electronic component, subjecting a suspected counterfeit electronic to an analytical method of ambient surface analysis to desorb and ionize compounds directly from a suspected counterfeit electronic surface with no pretreatment, detecting the resultant ions, comparing the identified ions to known standards, and returning a confidence that the suspected counterfeit electronic being analyzed is counterfeit.

Ambient sampling mass spectrometry and chemometric analysis for screening encapsulated electronic and electrical components for counterfeits

A combined distance-of-flight mass spectrometry (DOFMS) and time-of-flight mass spectrometry (TOFMS) instrument includes an ion source configured to produce ions having varying mass-to-charge ratios, a first detector configured to determine when each of the ions travels a predetermined distance, a second detector configured to determine how far each of the ions travels in a predetermined time, and a detector extraction region operable to direct portions of the ions either to the first detector or to the second detector.

Combined distance-of-flight and time-of-flight mass spectrometer

Novel methods and instrumentation for mass spectrometry are described. Zoom-time of flight mass spectrometry (Zoom-TOF) allows increased mass resolution over a pre-determined specific range of masses. Methods for retrofitting traditional time-of-flight (TOF) and distance of flight (DOF) mass spectrometers are described, as well as novel instruments capable of performing Zoom-TOF analyses.

Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry

Disclosed is an apparatus for performing mass spectrometry and a method of analyzing a sample through mass spectrometry. In particular, the disclosure relates to an apparatus capable of ambient mass spectrometry and mass spectral imaging and a method for the same. The apparatus couples laser ablation, flowing atmospheric-pressure afterglow ionization, and a mass spectrometer.

Laser ablation flowing atmospheric-pressure afterglow for ambient mass spectrometry

A method for ionizing and desorbing a sample for analysis includes energizing a first and second electrode to produce a glow discharge at atmospheric pressure. The method further includes supplying a carrier gas to at least a portion of the glow discharge to create effluents thereof. The method further includes conducting the effluents of the glow discharge to the sample to ionize and desorb the sample for analysis. An associated apparatus is also disclosed.

Methods and apparatus for ionization and desorption using a glow discharge

A method and apparatus for operating a mass spectrometer include providing at least two different ion sources, and coupling ion streams simultaneously from the at least two different ion sources to the spectrometer. Another method of operating a spectrometer includes a first coupling an ion stream from a first one of the ion sources into the spectrometer, next coupling an ion stream from a second one of the ion sources into the spectrometer, next coupling an ion stream from the second one of the ion sources into the spectrometer, and next coupling an ion stream from the first one of the ion sources into the spectrometer.

Growing community of inventors

Bloomington, IN, United States of America

Steven J Ray