Alamo, VA, United States of America

Steve R Lange


 

Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 30(Granted Patents)


Location History:

  • Alamo, VA (US) (2010)
  • Alamo, CA (US) (2002 - 2019)

Company Filing History:


Years Active: 2002-2019

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5 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Steve R. Lange

Introduction

Steve R. Lange is a notable inventor based in Alamo, Virginia, with a significant impact in the field of inspection systems and methods. He holds 5 patents that showcase his expertise and innovative thinking. His work primarily focuses on enhancing the efficiency and accuracy of inspection processes in various applications.

Latest Patents

Among his latest patents, Lange has developed methods and systems for monitoring a non-defect related characteristic of a patterned wafer. This computer-implemented method involves generating output responsive to light from a patterned wafer using an inspection system. It also includes determining differences between a value of a non-defect related characteristic of the patterned wafer and a known value based on various attributes of the output.

Another significant patent involves methods and systems for inspecting a specimen using different inspection parameters. This method determines optimal parameters for inspection based on selected defects and sets the parameters of an inspection system accordingly. It also includes illuminating the specimen with light of varying wavelengths and processing signals to detect defects or process variations.

Career Highlights

Steve R. Lange has worked with prominent companies in the technology sector, including KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. His experience in these organizations has contributed to his development of innovative inspection methods and systems.

Collaborations

Throughout his career, Lange has collaborated with talented individuals such as Tao-Yi Fu and Paul Frank Marella. These collaborations have further enriched his work and led to advancements in inspection technologies.

Conclusion

Steve R. Lange's contributions to the field of inspection systems are noteworthy, with his innovative patents reflecting his dedication to improving technology. His work continues to influence the industry and inspire future innovations.

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