Corrales, NM, United States of America

Steve Gutierrez

This inventor holds 1 USPTO granted patent. Top assignee: Parametric Technology Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Steve Gutierrez. Retrieved from https://idiyas.com/inventor/steve-gutierrez-lzz6tute

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations by Steve Gutierrez

Introduction

Steve Gutierrez is an accomplished inventor based in Corrales, NM (US). He has made significant contributions to the field of computer-aided design through his innovative patent. His work focuses on enhancing the accuracy and efficiency of 3D modeling.

Latest Patents

Steve Gutierrez holds a patent for a "Method for comparing first computer-aided 3D model with a second computer-aided 3D model." This invention relates to a method for comparing two computer-aided 3D models, each described by their respective topologies. The method involves scanning both topologies, deriving topological maps, and determining mappings between vertices, edges, and faces of the models. This process allows for a linear comparison of the two models for geometrical sameness.

Career Highlights

Steve Gutierrez is currently associated with Parametric Technology Corporation, where he applies his expertise in computer-aided design. His innovative approach has contributed to advancements in the field, particularly in the realm of 3D modeling.

Collaborations

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Conclusion

Steve Gutierrez's contributions to the field of computer-aided design through his patent demonstrate his innovative spirit and dedication to improving technology. His work continues to influence the way 3D models are compared and analyzed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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