The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2013
Filed:
Feb. 28, 2007
Steve Gutierrez, Corrales, NM (US);
Steve Gutierrez, Corrales, NM (US);
Parametric Technology Corporation, Needham, MA (US);
Abstract
The invention relates to a method for comparing a first computer-aided 3D model with a second computer-aided 3D model, the first model being described by a first topology comprising vertices, edges and faces of the first model and the second model being described by a second topology comprising vertices, edges and faces of the second model, the method comprising the following steps: scanning the first topology and the second topology; deriving from the first topology a first topological map relating vertices, edges and faces of the first model and from the second topology a second topological map relating vertices, edges and faces of the second model; determining by means of the topological maps all possible mappings between vertices of the first model and vertices of the second model; using those mapped vertices to identify all possible mappings between edges of the first and edges of the second model; using those mapped edges to identify all possible mappings between faces of the first and faces of the second model; using those mapped elements to linearly compare the first and the second model for geometrical sameness.