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Needham, MA, United States of America

Parametric Technology Corporation

USPTO Granted Patents = 30

% Expired Patents = 33.3

Trademarks = 14

Forward Citations = 598

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61 inventors (with patents filed for the assignee):

Emmanuel Gerlovin (4 out of 6 patents)

Dmitriy Shkolnik (3 out of 3 patents)

Jose A Cro Granito (3 out of 3 patents)

4. Leonid Ryvchin (2 out of 4 patents)

5. John Christopher Buchowski (2 out of 2 patents)

6. Asa Gray Trainer (2 out of 2 patents)

7. Vadim Kleyman (2 out of 2 patents)

8. Serge Elnitsky (2 out of 2 patents)

9. Kevin M Ryan (2 out of 2 patents)

10. Kenneth W Kiss (2 out of 2 patents)

11. Ganesh Krishnan (1 out of 10 patents)

12. Michael A Reitman (1 out of 3 patents)

13. Sergey Gurin (1 out of 3 patents)

14. Vitaly Kapelevich (1 out of 39 patents)

15. Arkadi Popov (1 out of 4 patents)

Core Competencies:

Computer-Aided Design

Dynamic Loading

Parametric Constraints

Product Design

3D Models

Supply Chain Management

Collaboration

Geometric Models

Interoperability

Data Synchronization

Technical Drawings

Image Generation

30 patents: Sort by Forward Citations

1. 8892404 - Methods and systems for consistent concurrent operation of a plurality of computer-aided design applications (2014-11-18),

2. 8890867 - Methods and systems for dynamically loading portions of a computer-aided design model on demand (2014-11-18),

3. 8818769 - Methods and systems for managing synchronization of a plurality of information items of a computer-aided design data model (2014-08-26),

4. 8589128 - Methods and systems for creation of a dynamically configurable product design (2013-11-19),

5. 8566066 - Enforcing parametric constraints in a direct modeling interface in computer-aided design (2013-10-22),

6. 8422763 - Method for comparing first computer-aided 3D model with a second computer-aided 3D model (2013-04-16),

7. 8352297 - Supply chain management (2013-01-08),

8. 8250057 - Method for automatically sensing a set of items (2012-08-21),

9. 8154545 - Method for producing technical drawings from 3D models with at least two colliding 3D bodies (2012-04-10),

10. 8121998 - Method for automatically enabling traceability of engineering calculations (2012-02-21),

11. 8082322 - Federation of information from multiple data sources into a common, role-based distribution model (2011-12-20),

12. 7661101 - Synchronous and asynchronous collaboration between heterogeneous applications (2010-02-09),

13. 7574329 - Object model for decision and issue tracking (2009-08-11),

14. 7529773 - Idea service for automatic file naming and storing (2009-05-05),

15. 7529763 - System and method for providing dynamic client architecture in an application development environment (2009-05-05),

Company Overview

Parametric Technology Corporation, headquartered in Needham, MA, specializes in developing software solutions for product design and lifecycle management. The company is renowned for its innovative applications in computer-aided design (CAD), product data management (PDM), and the Internet of Things (IoT). PTC's technologies empower organizations across various industries, including manufacturing and engineering, to enhance product development processes, improve collaboration, and drive digital transformation initiatives.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

30 Patents

#4 in Needham, MA

#671 in Massachusetts

#11,272 in US

#21,888 in the World

Needham, MA, United States of America

Parametric Technology Corporation

Forward Citations = 598

61 inventors:

Emmanuel Gerlovin (4 out of 6 patents)

Dmitriy Shkolnik (3 out of 3 patents)

Jose A Cro Granito (3 out of 3 patents)

4. Leonid Ryvchin (2 out of 4 patents)

5. John Christopher Buchowski (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Parametric Technology Corporation. Retrieved from https://idiyas.com/company/parametric-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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