Portland, OR, United States of America

Stephen LaFrance


Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2017-2022

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4 patents (USPTO):Explore Patents

Title: The Innovations of Stephen LaFrance

Introduction

Stephen LaFrance is an accomplished inventor based in Portland, OR (US). He has made significant contributions to the field of test and measurement instruments, holding a total of 4 patents. His work focuses on enhancing the functionality and usability of these instruments, making them more effective for users.

Latest Patents

One of Stephen's latest patents is titled "Acquiring and displaying multiple waveforms in a test and measurement instrument." This invention involves a test and measurement instrument that includes a display and one or more processors. The instrument is designed to display a waveform viewing area and can receive a selection of a viewing mode. When the overlay viewing mode is selected, it displays two or more waveforms overlaid in a single graticule. In contrast, when the stacked viewing mode is selected, it shows a first waveform in a first slice with its own graticule and a second waveform in a second slice below the first slice.

Career Highlights

Stephen LaFrance is currently employed at Tektronix, Inc., a leading company in the field of test and measurement solutions. His innovative work has contributed to the advancement of technology in this sector, making significant impacts on how measurements are taken and displayed.

Collaborations

Throughout his career, Stephen has collaborated with talented individuals such as Jessica Anna Dunn and James D Pileggi. These collaborations have fostered a creative environment that encourages innovation and the development of new ideas.

Conclusion

In summary, Stephen LaFrance is a notable inventor whose work in test and measurement instruments has led to valuable patents and advancements in technology. His contributions continue to influence the industry and improve the functionality of measurement tools.

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