The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2022
Filed:
Jun. 04, 2019
Applicant:
Tektronix, Inc., Beaverton, OR (US);
Inventors:
Gary J. Waldo, Hillsboro, OR (US);
Stephen LaFrance, Portland, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01); G06F 3/0481 (2013.01); G06F 3/0484 (2013.01);
U.S. Cl.
CPC ...
G01R 13/0236 (2013.01); G06F 3/0481 (2013.01); G06F 3/0484 (2013.01);
Abstract
A test and measurement instrument, comprising a display and one or more processors configured to display a waveform viewing area, receive a selection of a viewing mode. When an overlay viewing mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area, and when a stacked viewing mode is selected, display a first waveform in a first slice having a first graticule in the waveform viewing area and display a second waveform in a second slice having a second graticule below the first slice in the waveform viewing area.