Company Filing History:
Years Active: 2005-2025
Title: The Innovative Contributions of Stephen Hiebert
Introduction
Stephen Hiebert is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of metrology and imaging technologies. With a total of 3 patents, Hiebert's work focuses on advanced systems and methods for generating volumetric data and inspecting specimens.
Latest Patents
Hiebert's latest patents include innovative technologies such as 3D profilometry with a Linnik interferometer. This patent discloses systems and methods for generating volumetric data by scanning a sample at multiple focal planes along the depth direction. The process involves generating images of a volumetric field of view and aggregating these images to create comprehensive volumetric data. Another significant patent focuses on multi-dimensional metrology and inspection of specimens, such as bumped wafers. This method utilizes partial oblique illumination to form images and determine structural heights, integrating intensity to assess dimensions and detect defects.
Career Highlights
Throughout his career, Hiebert has worked with prominent companies in the technology sector, including KLA-Tencor Technologies Corporation and KLA Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in metrology and imaging.
Collaborations
Hiebert has collaborated with notable professionals in his field, including Tim S. Wihl and Richard J. Schmidley. These collaborations have contributed to the advancement of technologies in metrology and imaging.
Conclusion
Stephen Hiebert's contributions to the field of metrology and imaging technologies are noteworthy. His innovative patents and collaborations reflect his commitment to advancing these critical areas of research and development.