Aberdeen, NJ, United States of America

Stephen H Ellis

This inventor holds 1 USPTO granted patent. Top assignee: Avaya Inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stephen H Ellis. Retrieved from https://idiyas.com/inventor/stephen-h-ellis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Stephen H Ellis

Introduction

Stephen H Ellis is a notable inventor based in Aberdeen, NJ (US). He has made significant contributions to the field of distributed measurement systems. With a focus on enhancing monitoring systems, his work has implications for various applications in network environments.

Latest Patents

Stephen H Ellis holds a patent for a "Distributed measurement system configurator tool." This innovative monitoring system is designed to gather both site-to-site measurements and agent-to-agent measurements. The system operates in a distributed network environment, allowing for efficient testing between agents located at different sites. By determining a measurement rate that can detect user-perceivable events without overwhelming the agents, this invention optimizes the performance of distributed measurement systems.

Career Highlights

Stephen is currently employed at Avaya Inc., where he continues to develop and refine technologies related to communication and measurement systems. His expertise in this area has positioned him as a valuable asset to his team and the company.

Collaborations

Stephen has collaborated with talented coworkers, including Sean P Finn and Kanzhe Jiang. Their combined efforts contribute to the advancement of innovative solutions within their field.

Conclusion

Stephen H Ellis exemplifies the spirit of innovation through his work on distributed measurement systems. His contributions not only enhance technological capabilities but also pave the way for future advancements in monitoring systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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