The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Sep. 26, 2007
Stephen H. Ellis, Aberdeen, NJ (US);
Sean Finn, Palo Alto, CA (US);
Kanzhe Jiang, Mountain View, CA (US);
Jose-miguel Pulido, Barcelona, ES;
Faisal Siddiqi, Santa Clara, CA (US);
Stephen H. Ellis, Aberdeen, NJ (US);
Sean Finn, Palo Alto, CA (US);
Kanzhe Jiang, Mountain View, CA (US);
Jose-Miguel Pulido, Barcelona, ES;
Faisal Siddiqi, Santa Clara, CA (US);
Avaya Inc., Basking Ridge, NJ (US);
Abstract
A monitoring system gathers both site-to-site measurements, and agent-to-agent measurements, wherein one or more agents are distributed in one or more sites in a distributed network environment. Site-to-site measurements between two sites, such as site one and site two, are obtained by testing between any agent at site one and any agent at site two. A measurement rate between sites and between agents is determined that allows for the detection of events, such as user perceivable events, without overwhelming the set of agents that form the distributed measurement system. With, for example, a scheduling mechanism used to schedule measurement tests of finite duration, as opposed to continuous streams of measurement packets, for each pair of agents, the test can be used as an indication as to whether the measurement system is overwhelmed.