Biarritz, France

Stephane Durant


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stephane Durant

Introduction

Stephane Durant is a notable inventor based in Biarritz, France. He has made significant contributions to the field of optical defect inspection, showcasing his expertise through his innovative patent.

Latest Patents

One of Stephane Durant's key patents is titled "Optical defect amplification for improved sensitivity on patterned layers." This patent outlines a method for wafer defect inspection that includes providing an inspection target, applying defect inspection enhancements, illuminating the target to generate inspection signals, detecting these signals, and generating inspection parameters. The inspection target may consist of at least one inspection layer and one enhancement layer, demonstrating the complexity and utility of his invention.

Career Highlights

Stephane Durant is associated with Kla Tencor Corporation, a company known for its advanced technology in the semiconductor industry. His work there has allowed him to develop and refine his innovative ideas, contributing to the company's reputation for excellence in defect inspection technologies.

Collaborations

Throughout his career, Stephane has collaborated with talented individuals such as Steven R Lange and Gregory Kirk. These partnerships have likely enriched his work and fostered a collaborative environment that encourages innovation.

Conclusion

Stephane Durant's contributions to optical defect inspection through his patent and work at Kla Tencor Corporation highlight his role as an influential inventor in the field. His innovative methods continue to impact the industry positively.

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