Senftenberg, Germany

Steffen Laube


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Steffen Laube: Innovator in Semiconductor Measurement Technology

Introduction

Steffen Laube is a notable inventor based in Senftenberg, Germany. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of electronic components. His innovative approach has led to the development of a patented method that enhances the testing and examination of semiconductor devices.

Latest Patents

Steffen Laube holds a patent for a "Method for measurement of a device under test." This method is designed for the measurement of wafers and other semiconductor components in a probe station. The invention allows for the examination and testing of electronic components by holding the device under test with a chuck and utilizing at least one electric probe supported by a probe support. The positioning device, equipped with electric drives, selectively positions the device under test and the probe relative to each other, ensuring accurate contact and measurement.

Career Highlights

Steffen Laube is currently employed at Suss Microtec Test Systems GmbH, a company known for its advanced semiconductor manufacturing equipment. His work at Suss Microtec has allowed him to apply his innovative ideas in a practical setting, contributing to the advancement of semiconductor testing technologies.

Collaborations

Steffen collaborates with talented professionals in his field, including coworkers Axel Schmidt and Frank Fehrmann. Their combined expertise fosters an environment of innovation and progress within the company.

Conclusion

Steffen Laube's contributions to semiconductor measurement technology exemplify the impact of innovation in the electronics industry. His patented method not only enhances testing accuracy but also reflects his commitment to advancing technology in this critical field.

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