Copenhagen, Denmark

Stefan Othmar Poulsen



Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: Innovations by Stefan Othmar Poulsen

Introduction

Stefan Othmar Poulsen is a notable inventor based in Copenhagen, Denmark. He has made significant contributions to the field of X-ray diffraction methods, particularly in mapping grain structures in crystalline and polycrystalline material samples. His innovative approaches have led to the development of advanced techniques that enhance the understanding of material properties.

Latest Patents

Stefan Poulsen holds 2 patents related to X-ray diffraction methods. His latest patents include an X-ray diffraction method of mapping grain structures in a crystalline material sample and an X-ray diffraction apparatus. The first patent describes a method where an X-ray detector detects substantially line-shaped segments from beams diffracted from grains. A processing device analyzes the values received from the X-ray detector to identify the position and length of these segments. The paired segments are used to determine the crystallographic grain position and width within the polycrystalline material sample. The second patent outlines a similar method, where the processing device discretizes an initial three-dimensional model of the polycrystalline material into voxels, reconstructing the grains by associating crystallographic orientations to the detected segments.

Career Highlights

Stefan Poulsen has worked at Danmarks Tekniske Universitet, contributing to research and development in his field. His work has been instrumental in advancing the understanding of material structures through innovative X-ray diffraction techniques.

Collaborations

Stefan has collaborated with notable colleagues such as Erik Mejdal Lauridsen and Christian Holzner, enhancing the research output and innovation in his projects.

Conclusion

Stefan Othmar Poulsen's contributions to X-ray diffraction methods have significantly impacted the field of material science. His innovative patents and collaborative efforts continue to advance the understanding of crystalline structures.

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