Carl Zeiss X-ray Microscopy, Inc.

Danmarks Tekniske Universitet of Anker Engelundsvej

Danmarks Tekniske Universitet Anker Engelundsvej

Xnovo Technology Aps

Stefan Othmar Poulsen

Erik Mejdal Lauridsen

Michael Feser

Peter Reischig

Christian Holzner

Péter Reischig

An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.

X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus

An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.

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Copenhagen, Denmark

Stefan Othmar Poulsen