The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Mar. 05, 2014
Danmarks Tekniske Universitet, Lyngby, DK;
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Erik Mejdal Lauridsen, Harlev, DK;
Stefan Othmar Poulsen, Copenhagen, DK;
Peter Reischig, Leicestershire, GB;
Danmarks Tekniske Universitet Anker Engelundsvej, Lyngby, DK;
CARL ZEISS X-RAY MICROSCOPY, INC., Pleasanton, CA (US);
Abstract
An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.