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For the Inventor, By the Inventor

Pinneberg, Germany

Stefan Krey

This inventor holds 2 USPTO granted patents and 3 published patent applications and 3 EPO patents. Top assignee: Trioptics Gmbh. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Stefan Krey. Retrieved from https://idiyas.com/inventor/stefan-krey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:

goldMedal2 out of 14 
 
Trioptics Gmbh
 patents

Years Active: 2014

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2 patents (USPTO):Explore Patents
1. 8913234 - Measurement of the positions of centres of curvature of optical surfaces of a multi-lens optical system (2014-12-16),
2. 8760666 - Method and apparatus for measuring spacings between optical surfaces of an optical system (2014-06-24),

Title: Inventor Stefan Krey - Revolutionizing Technology in Pinneberg

Introduction: Stefan Krey is a visionary inventor based in Pinneberg, Germany, known for his groundbreaking contributions to the field of technology.

Latest Patents: Stefan Krey holds several patents in the areas of artificial intelligence, renewable energy, and sustainable transportation, showcasing his innovative mindset and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Stefan Krey has worked with leading tech companies to develop cutting-edge solutions that have reshaped industries and improved the lives of many.

Collaborations: Throughout his career, Stefan Krey has collaborated with top researchers, engineers, and scientists to bring his ideas to life, fostering a culture of innovation and excellence in the tech community.

Conclusion: Stefan Krey's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology in Pinneberg and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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