The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Nov. 22, 2011
Josef Heinisch, Wedel, DE;
Stefan Krey, Pinneberg, DE;
Eugen Dumitrescu, Wedel, DE;
Aiko Ruprecht, Wedel, DE;
Patrik Langehanenberg, Hamburg, DE;
Josef Heinisch, Wedel, DE;
Stefan Krey, Pinneberg, DE;
Eugen Dumitrescu, Wedel, DE;
Aiko Ruprecht, Wedel, DE;
Patrik Langehanenberg, Hamburg, DE;
Trioptics GmbH, Wedel, DE;
Abstract
A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.