The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Nov. 22, 2011
Josef Heinisch, Wedel, DE;
Stefan Krey, Pinneberg, DE;
Eugen Dumitrescu, Wedel, DE;
Aiko Ruprecht, Wedel, DE;
Patrik Langehanenberg, Hamburg, DE;
Josef Heinisch, Wedel, DE;
Stefan Krey, Pinneberg, DE;
Eugen Dumitrescu, Wedel, DE;
Aiko Ruprecht, Wedel, DE;
Patrik Langehanenberg, Hamburg, DE;
Trioptics GmbH, Wedel, DE;
Abstract
A method measures the positions of centers of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centers of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the center of curvature of a surface situated within the optical system, the measured positions of the centers of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.