This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Bruker Nano Gmbh. Active years: 2014-2015.
Company Filing History:
Years Active: 2014-2015
Title: The Innovations of Stefan B. Kaemmer
Introduction
Stefan B. Kaemmer is a notable inventor based in Santa Barbara, CA. He has made significant contributions to the field of metrology, particularly in the area of physical property measurement. With a total of 2 patents to his name, Kaemmer's work is recognized for its innovative approach and practical applications.
Latest Patents
One of his latest patents is titled "Method and apparatus of physical property measurement using a probe-based nano-localized light source." This invention provides an apparatus and method for performing physical property measurements on a sample using a probe-based metrology instrument that employs a nano-confined light source. In this embodiment, an SPM probe tip is designed to support a receiving element, allowing for efficient and localized excitation of the sample on the nanoscale. The separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, utilizing an AFM TR Mode control scheme.
Career Highlights
Stefan B. Kaemmer is currently associated with Bruker Nano GmbH, where he continues to advance the field of nanotechnology and metrology. His work has been instrumental in developing new methods that enhance the precision of physical property measurements.
Collaborations
Throughout his career, Kaemmer has collaborated with esteemed colleagues such as Markus B. Raschke and Stephen C. Minne. These collaborations have further enriched his research and contributed to the advancement of innovative technologies in his field.
Conclusion
Stefan B. Kaemmer's contributions to the field of metrology through his innovative patents and collaborations highlight his role as a leading inventor. His work continues to influence advancements in physical property measurement technologies.