This inventor holds 4 USPTO granted patents. Top assignee: Tektronix, Inc.. Active years: 2022-2026.
Company Filing History:
Years Active: 2022-2026
Title: Sriram Mandyam Krishnakumar: Innovator in Test and Measurement Technologies
Introduction
Sriram Mandyam Krishnakumar is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of test and measurement technologies, holding a total of 4 patents. His work focuses on enhancing the accuracy and efficiency of data analysis in various applications.
Latest Patents
Sriram's latest patents include a technique to analyze and report accurate data by synchronizing multiple signals in a memory chip. This innovative test and measurement system features a multi-stack test subsystem that includes several test and measurement instruments. Each instrument is connected to a device under test (DUT) to receive multiple test signals during operation. One instrument acts as a master, communicating control signals to extension instruments to synchronize the acquisition of test signals. An automation engine analyzes these signals to perform validation testing and display results simultaneously.
Another significant patent involves a system and method for detecting anomalies in test and measurement results of a DUT. This device includes an interface and connectors for connecting to test instruments. It utilizes machine learning models to identify potentially anomalous test results and presents a comprehensive representation of the test data.
Career Highlights
Sriram currently works at Tektronix, Inc., where he continues to innovate in the field of test and measurement technologies. His expertise and contributions have positioned him as a key figure in his organization.
Collaborations
Sriram collaborates with talented professionals such as Mahesha Guttahalli Lakshmipathy and Satish Kumar Makanahalli Ramaiah. Their combined efforts contribute to the advancement of technology in their field.
Conclusion
Sriram Mandyam Krishnakumar is a distinguished inventor whose work in test and measurement technologies has led to significant advancements. His innovative patents and collaborations reflect his commitment to enhancing data analysis and accuracy in various applications.