The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Jan. 10, 2020
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Sriram Mandyam Krishnakumar, Bengaluru, IN;

Mahesha Guttahalli Lakshmipathy, Bengaluru, IN;

Satish Kumar Makanahalli Ramaiah, Bengaluru Rural District, IN;

Vishnu Vardhan Kandan, Bengaluru, IN;

Rovin Jolly Pulikken, Bengaluru, IN;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318307 (2013.01); G01R 31/2834 (2013.01); G01R 31/318314 (2013.01);
Abstract

Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.


Find Patent Forward Citations

Loading…