This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Sooseok Lee: Innovator in Semiconductor Technology
Introduction
Sooseok Lee is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor technology, holding 2 patents that showcase his innovative approach to non-destructive inspection methods and semiconductor device fabrication.
Latest Patents
Lee's latest patents include a non-destructive inspection method that involves inspecting multiple observation sites. This method detects ultrasonic signals emitted from various observation sites and inspects a target structure, which includes a structure of interest. The inspection process is designed to enhance the accuracy and efficiency of semiconductor manufacturing. His second patent focuses on a method of fabricating a semiconductor device, which includes positioning ultrasonic wave receiving probes on a substrate and transmitting ultrasonic waves to receive reflection signals. This innovative approach aims to improve the testing and fabrication processes of semiconductor devices.
Career Highlights
Sooseok Lee is currently employed at Samsung Electronics Ltd., where he continues to push the boundaries of semiconductor technology. His work has been instrumental in developing advanced methods that enhance the reliability and performance of semiconductor devices.
Collaborations
Lee collaborates with talented coworkers, including Donghyun Lee and Sung Yoon Ryu, who contribute to the innovative environment at Samsung Electronics Ltd.
Conclusion
Sooseok Lee's contributions to semiconductor technology through his patents and work at Samsung Electronics Ltd. highlight his role as a key innovator in the field. His dedication to advancing inspection methods and fabrication techniques continues to impact the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile