Company Filing History:
Years Active: 2006-2021
Title: Slimane Boutobza: Innovator in Test Pattern Validation and Memory Testing
Introduction
Slimane Boutobza is a notable inventor based in Grenoble, France. He has made significant contributions to the field of automatic test pattern generation and memory testing. With a total of 2 patents, his work has advanced the methodologies used in electronic testing.
Latest Patents
One of Slimane's latest patents is an "Automatic testbench generator for test-pattern validation." This invention involves a computer-implemented method, system, and computer-program product for automatic test-pattern generation (ATPG) validation. The process includes parsing an ATPG input, semantically analyzing it, generating a first HDL model, creating an HDL testbench, simulating an ATE test of a circuit structure, and outputting a validation result based on the simulation. The HDL model represents the circuit structure as functionally equivalent to the ATPG input, ensuring efficient validation.
Another significant patent is the "Programmable test for memories." This invention describes a programmable built-in self-test (BIST) system for testing memory. It comprises an instruction register formed on the same chip as the memory, a circuit for loading the register with successive instructions, and a cycle controller for executing operations based on the address control field. This innovation enhances the testing capabilities of memory systems.
Career Highlights
Slimane has worked with prominent companies in the technology sector, including Iroc Technologies and Synopsys, Inc. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge projects in electronic testing.
Collaborations
Throughout his career, Slimane has collaborated with talented individuals such as Michaël Nicolaidis and Andrea Costa. These partnerships have fostered innovation and the exchange of ideas in the field of electronic testing.
Conclusion
Slimane Boutobza's contributions to automatic test pattern generation and memory testing have made a significant impact in the technology industry. His innovative patents and collaborative efforts continue to shape the future of electronic testing methodologies.
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