Sunnyvale, CA, United States of America

Siu May Ho


Average Co-Inventor Count = 4.2

ph-index = 3

Forward Citations = 24(Granted Patents)


Location History:

  • San Jose, CA (US) (2004)
  • Sunnyvale, CA (US) (2006 - 2014)

Company Filing History:


Years Active: 2004-2014

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4 patents (USPTO):Explore Patents

Title: Siu May Ho: Innovator in Semiconductor Testing Technologies

Introduction

Siu May Ho is a prominent inventor based in Sunnyvale, CA, known for her contributions to semiconductor testing technologies. With a total of 4 patents to her name, she has made significant advancements in the field, particularly in methods for storing and retrieving semiconductor tester information.

Latest Patents

One of her latest patents is titled "Method and system for storing and retrieving semiconductor tester information." This innovative system provides test equipment for generating test data. A markup language encoder connected to the test equipment encodes the test data for storage in an object-oriented database management system. Additionally, a user interface is operatively connected to the database for the retrieval of the test data. Another notable patent is "Efficient storage of fail data to aid in fault isolation." This method and system for fault isolation in semiconductors includes determining test data from multiple semiconductor devices and creating a failure bitmap of locations. The test data is stored in a vector graphic CAD format, allowing for efficient storage on multiple layers.

Career Highlights

Siu May Ho is currently employed at Advanced Micro Devices Corporation, where she continues to develop innovative solutions in semiconductor technology. Her work has been instrumental in enhancing the efficiency and reliability of semiconductor testing processes.

Collaborations

Some of her notable coworkers include Srikanth Sundararajan and Shivananda S Shetty, who have collaborated with her on various projects within the semiconductor industry.

Conclusion

Siu May Ho's contributions to semiconductor testing technologies through her patents and work at Advanced Micro Devices Corporation highlight her role as a key innovator in the field. Her advancements continue to influence the efficiency of semiconductor testing and fault isolation processes.

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