The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2009

Filed:

Jul. 01, 2004
Applicants:

Srikanth Sundararajan, Sunnyvale, CA (US);

Siu May Ho, Sunnyvale, CA (US);

Shivananda S. Shetty, Sunnyvale, CA (US);

Inventors:

Srikanth Sundararajan, Sunnyvale, CA (US);

Siu May Ho, Sunnyvale, CA (US);

Shivananda S. Shetty, Sunnyvale, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for fault isolation in semiconductor with devices thereon includes determining test data from a plurality of semiconductor devices and creating a failure bitmap of locations of the plurality of semiconductor devices and test data in a vector graphic CAD format. The vector graphic CAD format allows storage of test data on multiple layers.


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