This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignees: Globalfoundries Singapore Pte. Ltd., Carl Zeiss Smt Gmbh. Active years: 2017-2021.
Company Filing History:

Years Active: 2017-2021
Title: Si Ping Zhao: Innovator in Semiconductor Inspection Technologies
Introduction
Si Ping Zhao is a notable inventor based in Singapore, recognized for his contributions to semiconductor inspection technologies. With a total of 3 patents, Zhao has made significant advancements in methods and devices that enhance the analysis of semiconductor samples.
Latest Patents
Zhao's latest patents include a method and device for the inspection of semiconductor samples. This innovative method involves sandwiching a processed semiconductor sample between two blocks of semiconductor material, polishing the sample to achieve an even surface, and measuring the surface for analysis. Additionally, he has developed methods for evaluating semiconductor device structures. This method entails forming a support layer on one side of a lamellar sample portion, milling the second side to create a reduced thickness, and evaluating the target analysis area of the sample.
Career Highlights
Throughout his career, Zhao has worked with prominent companies in the semiconductor industry, including Globalfoundries Singapore Pte. Ltd. and Carl Zeiss SMT GmbH. His experience in these organizations has contributed to his expertise in semiconductor technologies and innovation.
Collaborations
Zhao has collaborated with notable professionals in the field, including Jie Zhu and Binghai Liu. These partnerships have further enriched his work and contributed to the development of advanced semiconductor inspection methods.
Conclusion
Si Ping Zhao's innovative work in semiconductor inspection technologies has established him as a key figure in the industry. His patents reflect a commitment to enhancing the evaluation and analysis of semiconductor devices, paving the way for future advancements in the field.