This inventor holds 2 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2020-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020-2021
Title: Shunji Tachibana: Innovator in Device Testing Technologies
Introduction
Shunji Tachibana is a notable inventor based in San Jose, CA. He has made significant contributions to the field of device testing and debugging. With a total of 2 patents to his name, Tachibana's work has been instrumental in enhancing the efficiency of testing systems.
Latest Patents
Tachibana's latest patents focus on methods and systems for the acquisition of test data. These inventions facilitate efficient and effective device testing and debugging. In one embodiment, a tester system includes a controller processor, a plurality of programmable accelerator circuits, and a plurality of load boards. The programmable accelerator circuits provide input test signals and capture output test signals. The load boards apply the input test signals to devices under test (DUTs) and capture the output test signals. Each load board comprises connections for transmitting input test signals and receiving output test signals, along with sideband connectors that receive test-related information from the DUT.
Career Highlights
Shunji Tachibana is currently employed at Adv Antest Corporation, where he continues to innovate in the field of device testing. His work has contributed to advancements in testing methodologies that are crucial for the development of reliable electronic devices.
Collaborations
Tachibana has collaborated with talented coworkers such as Ben Rogel-Favila and Mei-Mei Su. Their combined expertise has fostered a collaborative environment that encourages innovation and problem-solving.
Conclusion
Shunji Tachibana is a prominent figure in the realm of device testing technologies. His inventions and collaborations have significantly impacted the efficiency of testing systems, making him a valuable contributor to the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
