Oyama, Japan

Shun Mashiro

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignees: Semiconductor Energy Laboratory Co., Ltd., Semiconductor Energy Laboratory Co., Ltd.. Active years: 2015-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shun Mashiro. Retrieved from https://idiyas.com/inventor/shun-mashiro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 75.0

Average Co-Inventor Count = 5.1

ph-index = 3

Forward Citations = 24(Granted Patents)


Location History:

  • Oyama, JP (2015 - 2016)
  • Tochigi, JP (2016)

Company Filing History:


Years Active: 2015-2026

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4 patents (USPTO):Explore Patents

Title: Shun Mashiro - Innovator in Display Technology

Introduction

Shun Mashiro is an inventor based in Oyama, Tochigi, Japan. He is known for his innovative approach to display technology, particularly in the fabrication of high-resolution display devices. His work focuses on enhancing display quality while maintaining high resolution, which is crucial in today's technology-driven world.

Latest Patent Applications

Shun Mashiro has filed a patent application titled "METHOD OF FABRICATING DISPLAY DEVICE." This application outlines a method for creating a display device that achieves both high display quality and high resolution. The process involves several steps, including the formation of EL films and sacrificial films, etching processes to create layers, and the application of insulating films. This method aims to improve the overall performance of display devices, making them more efficient and effective.

Conclusion

Shun Mashiro's contributions to display technology through his innovative patent application demonstrate his commitment to advancing the field. His work has the potential to significantly impact the quality of display devices in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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