Chiba, Japan

Shuji Hatada

This inventor holds 1 USPTO granted patent. Top assignee: Resonac Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shuji Hatada. Retrieved from https://idiyas.com/inventor/shuji-hatada-0f9rdsix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shuji Hatada

Introduction

Shuji Hatada is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative patent. His work focuses on enhancing the efficiency and accuracy of surface inspections.

Latest Patents

Shuji Hatada holds a patent for an "Inspection condition presentation apparatus, surface inspection apparatus, inspection condition presentation method and program." This invention includes an intensity calculation part that calculates the intensity distribution of scattered light when inspection light is directed onto a surface containing various scatterers. The apparatus also features an incidence condition presentation part that identifies and presents the optimal incidence condition candidate to maximize the intensity of the scattered light.

Career Highlights

Hatada is currently employed at Resonac Corporation, where he continues to develop and refine his innovative technologies. His work at Resonac has positioned him as a key player in the advancement of inspection apparatuses.

Collaborations

Shuji Hatada collaborates with talented colleagues, including Katsuhisa Yoshida and Yoshishige Okuno. Their combined expertise contributes to the innovative environment at Resonac Corporation.

Conclusion

Shuji Hatada's contributions to inspection technology through his patent demonstrate his commitment to innovation. His work not only enhances inspection processes but also showcases the importance of collaboration in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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