Hsinchu, Taiwan

Shu-Ling Ku

This inventor holds 1 USPTO granted patent. Top assignee: Macronix International Co., Ltd.. Active years: 2004.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations of Shu-Ling Ku in Wafer Technology

Introduction

Shu-Ling Ku is an accomplished inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer defect monitoring. His innovative approach has the potential to enhance product yield and efficiency in semiconductor manufacturing.

Latest Patents

Shu-Ling Ku holds a patent for a method titled "True defect monitoring through repeating defect deletion." This invention focuses on identifying and managing repeating defects on wafers that do not impact product yield. By marking these areas as "don't care" regions, the method allows for more effective scanning to locate true defects, ultimately improving the quality of the semiconductor products.

Career Highlights

Shu-Ling Ku is currently employed at Macronix International Co., Ltd., a leading company in the semiconductor industry. His work at Macronix has positioned him as a key player in advancing wafer technology and defect management.

Collaborations

Shu-Ling Ku collaborates with talented colleagues, including Kung-Yi Chen and Wei-Ming Chen. These partnerships foster a creative environment that drives innovation and enhances the development of new technologies.

Conclusion

Shu-Ling Ku's contributions to wafer technology through his innovative patent demonstrate his expertise and commitment to improving semiconductor manufacturing processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
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