IDiyas

For the Inventor, By the Inventor

Tokyo, Japan

Shoichi Yasukawa

USPTO Granted Patents = 6

Average Co-Inventor Count = 1.4

ph-index = 3

Forward Citations = 15(Granted Patents)


Location History:

  • Akishima, JP (2008)
  • Hino-shi, JP (2014)
  • Tokyo, JP (2015 - 2016)
  • Hino, JP (2016 - 2019)

Company Filing History:

goldMedal6 out of 283 
 
Rigaku Corporation
 patents
silverMedal1 out of 851 
 
Riken Corporation
 patents
where one patent can have more than one assignee

Years Active: 2008-2019

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6 patents (USPTO):Explore Patents
1. 10401310 - X-ray stress analysis apparatus, method, and program (2019-09-03),
2. 9347895 - X-RAY diffraction apparatus, X-RAY diffraction measuring method, and control program (2016-05-24),
3. D750783 - X-ray residual stress measuring instrument (2016-03-01),
4. 8953743 - X-ray stress measurement method and apparatus (2015-02-10),
5. 8855266 - X-ray stress measurement apparatus (2014-10-07),
6. 7342995 - Apparatus for estimating specific polymer crystal (2008-03-11),
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