The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Mar. 04, 2014
Rigaku Corporation, Tokyo, JP;
Shoichi Yasukawa, Tokyo, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
The X-ray diffraction apparatus irradiates a sample with an X-ray and performs frame photographing in each X-ray diffraction angle, and includes a control section () controlling the frame photographing by scanning without closing a shutter, a data acquisition section () acquiring detection data of each frame which has been detected by a semiconductor pixel detector in the frame photographing, a frame integration section () integrating the detection data which has been acquired in each scanning for each frame, and a determination section () determining whether the integrated detection data has a sufficient intensity or not, and the control section () controls so as to finish measurement when the integrated detection data has a sufficient intensity and so as to perform the scanning again when the integrated detection data does not have a sufficient intensity.