Kanagawa, Japan

Sho Nagai

This inventor holds 4 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Ricoh Company, Ltd.. Active years: 2016-2018.

USPTO Granted Patents = 4 

% Patents Active = 50.0

 

Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2016-2018

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4 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Sho Nagai

Introduction

Sho Nagai is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of measurement technology, holding a total of 4 patents. His work focuses on developing advanced devices and methods for precise specimen measurement.

Latest Patents

Nagai's latest patents include a specimen measuring device and a computer program product. This innovative device features a light source that illuminates a specimen surface from multiple angles. It also incorporates a spectral camera that captures 2D spectral information through a single image. The calculating unit within the device analyzes the deflection angle spectral information to measure specific evaluation items of the specimen. Another notable patent is a measuring apparatus that includes an optical system to condense light and a light receiving device that converts the light into an electric signal. This apparatus utilizes various optical band-pass filters and a lens array to enhance measurement accuracy.

Career Highlights

Sho Nagai is currently employed at Ricoh Company, Ltd., where he continues to push the boundaries of measurement technology. His work has been instrumental in advancing the capabilities of optical measurement systems.

Collaborations

Nagai collaborates with talented coworkers, including Kensuke Masuda and Go Maruyama. Their combined expertise fosters an environment of innovation and creativity.

Conclusion

Sho Nagai's contributions to measurement technology exemplify the spirit of innovation. His patents reflect a commitment to enhancing precision in scientific measurements.

Profile summary based on public USPTO records.
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