The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Jun. 02, 2014
Yuji Yamanaka, Kanagawa, JP;
Go Maruyama, Kanagawa, JP;
Kensuke Masuda, Kanagawa, JP;
Sho Nagai, Kanagawa, JP;
Yuji Yamanaka, Kanagawa, JP;
Go Maruyama, Kanagawa, JP;
Kensuke Masuda, Kanagawa, JP;
Sho Nagai, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A measuring apparatus and a measuring method are provided. The measuring apparatus includes an optical system to condense light, a light receiving device to receive light condensed by the optical system at a plurality of light receiving positions and convert the light into an electric signal, a plurality of optical band-pass filters arranged near a lens stop of the optical system, each of the optical band-pass filters having a different spectral transmittance, a lens array arranged between the optical system and the light receiving device, the lens array having a plurality of lenses each of which is arranged substantially in parallel with a two-dimensional surface of the light receiving device, and a correction unit to correct the electric signal for each one of the plurality of light receiving positions of the light receiving device. The measuring method is performed by the measuring apparatus.