This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Shintaro Aoyama: Innovator in Atomic Layer Deposition
Introduction
Shintaro Aoyama is a notable inventor based in Kohfu, Japan. He has made significant contributions to the field of atomic layer deposition, a critical process in various technological applications. His innovative work has led to the development of a patent that enhances the efficiency and effectiveness of material layering techniques.
Latest Patents
Shintaro Aoyama holds a patent for "Structures and techniques for atomic layer deposition." This patent describes a method that includes forming at least one first monolayer of a first material on a substrate surface through a series of atomic layer deposition cycles. Following this, the first monolayer is annealed under an inert atmosphere at temperatures ranging from about 650°C to about 900°C. Subsequently, a second monolayer of a second material is formed, which partially overlaps the first monolayer, and is also annealed under similar conditions.
Career Highlights
Aoyama is currently associated with the International Business Machines Corporation (IBM), where he continues to push the boundaries of innovation in material science. His work is instrumental in advancing technologies that rely on precise material layering, which is essential for the development of modern electronic devices.
Collaborations
Shintaro Aoyama collaborates with esteemed colleagues such as Robert Daniel Clark and Steven Consiglio. These partnerships enhance the research and development efforts within their field, fostering an environment of innovation and creativity.
Conclusion
Shintaro Aoyama's contributions to atomic layer deposition exemplify the impact of innovative thinking in technology. His patent and ongoing work at IBM highlight the importance of advancements in material science for future technological developments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
