Yokohama, Japan

Shinkichi Gama


Average Co-Inventor Count = 4.2

ph-index = 4

Forward Citations = 81(Granted Patents)


Location History:

  • Kanagawa, JP (2001 - 2003)
  • Yokohama, JP (2002 - 2006)
  • Kawasaki, JP (2010 - 2013)

Company Filing History:


Years Active: 2001-2013

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9 patents (USPTO):Explore Patents

Title: Shinkichi Gama: Innovator in Memory Testing Technology

Introduction

Shinkichi Gama is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of memory testing technology, holding a total of nine patents. His innovative approaches have paved the way for advancements in how memory tests are conducted and evaluated.

Latest Patents

Among his latest patents is a memory test method and memory test device. This method involves sequentially generating a number of n-bit addresses, where the first to k-th bits are set to either 0 or 1, while the remaining bits are set to the opposite value. The process includes writing first test data to these addresses, reading second test data, and comparing the two sets of data. Another significant patent is for a test apparatus that includes an up counter, a down counter, a selector, an inversion circuit, and a comparison circuit. This apparatus is designed to enhance the efficiency and accuracy of memory testing.

Career Highlights

Shinkichi Gama has worked with prominent companies such as Fujitsu Corporation and Fujitsu Microelectronics Limited. His experience in these organizations has allowed him to develop and refine his innovative ideas in memory testing technology.

Collaborations

He has collaborated with notable coworkers, including Takeshi Nagase and Yoshiki Okumura. Their combined expertise has contributed to the successful development of various technologies in the field.

Conclusion

Shinkichi Gama's contributions to memory testing technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively.

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