Location History:
- Gyoda, JP (1997)
- Saitama, JP (1998)
Company Filing History:
Years Active: 1997-1998
Title: Innovator Shinichiro Kuroe: Pioneering Timing Calibration Technologies
Introduction
Shinichiro Kuroe, an accomplished inventor based in Gyoda, Japan, has made significant strides in the field of semiconductor testing technologies. With two patents to his name, Kuroe has contributed to advancements that enhance the reliability and efficiency of Integrated Circuit (IC) testing systems.
Latest Patents
Kuroe's notable patents include the "Delay Time Stabilization Circuit" and the "Timing Calibration Circuit and Method for Test Signals." The Delay Time Stabilization Circuit is integral to a timing generator used in semiconductor IC test systems. It features a delay control circuit, period generator, loop forming switch, and a period counter that collectively ensure precise timing during device under test (DUT) evaluations.
Moreover, the Timing Calibration Circuit is designed to regulate phase delays across multiple test signal paths. It consists of variable delay circuits, a multiplexer, and counters that measure phase delays to establish reference values for optimal testing accuracy. This innovation allows for precise calibration, ultimately leading to enhanced testing outcomes.
Career Highlights
Shinichiro Kuroe works at Adv Antest Corporation, a company known for its contributions to automated test equipment. His commitment to advancing testing technologies positions him as a key player in the industry. Kuroe's technical expertise has been instrumental in developing solutions that ensure high-quality performance in semiconductor testing.
Collaborations
Kuroe collaborates closely with fellow inventor Minoru Kobayashi, pooling their knowledge and skills to drive innovation. Their partnership exemplifies the effective collaboration that fosters technological advancements in the field.
Conclusion
Shinichiro Kuroe's contributions to the realm of semiconductor testing underscore his role as a leading inventor. Through his patents, he has demonstrated a deep understanding of timing control and calibration, providing solutions that benefit the industry and enhance testing accuracy. His work continues to influence future innovations in semiconductor technologies, ensuring a smarter and more efficient technological landscape.