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For the Inventor, By the Inventor

Akishima, Japan

Shingo Nakano

This inventor holds 11 USPTO granted patents and 1 EPO patent. Top assignees: Canon Kabushiki Kaisha, Fuji Jukogyo Kabushiki Kaisha. Active years: 1998-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shingo Nakano. Retrieved from https://idiyas.com/inventor/shingo-nakano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 11

% Patents Active = 36.4


Average Co-Inventor Count = 1.2

ph-index = 3

Forward Citations = 51(Granted Patents)


Location History:

  • Akishima, JP (2000 - 2014)
  • Tokyo, JP (1998 - 2015)
  • Toyko, JP (2015)
  • Chiba, JP (2016)

Company Filing History:

goldMedal10 out of 93,136 
 
Canon Kabushiki Kaisha
 patents
silverMedal1 out of 2,208 
 
Fuji Jukogyo Kabushiki Kaisha
 patents

Years Active: 1998-2016

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11 patents (USPTO):Explore Patents
1. 9382624 - Film formation method using oscillators for measurement and calibration during calibration step performed during film formation (2016-07-05),
2. 9172105 - Electronic equipment provided with battery check device (2015-10-27),
3. 8968952 - Electronic equipment provided with battery check device (2015-03-03),
4. 8723985 - Camera, camera system and lens apparatus (2014-05-13),
5. 8395690 - Camera, camera system and lens apparatus (2013-03-12),
6. 7939214 - Electronic equipment provided with voltage check unit (2011-05-10),
7. 7872684 - Camera capable of correcting information for focusing control, using information stored in storage section of mounted lens apparatus (2011-01-18),
8. 7630629 - Accessory unit and camera system (2009-12-08),
9. 6783480 - Control device for automatic transmission (2004-08-31),
10. 6097893 - Optical device (2000-08-01),
11. 5708890 - Tripod (1998-01-13),
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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