Sunnyvale, CA, United States of America

Shin Hwei Tan

This inventor holds 1 USPTO granted patent. Top assignee: Fujistu Limited. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shin Hwei Tan. Retrieved from https://idiyas.com/inventor/shin-hwei-tan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shin Hwei Tan

Introduction

Shin Hwei Tan is an accomplished inventor based in Sunnyvale, CA. He has made significant contributions to the field of software engineering, particularly in the area of software program repair. His innovative approach to identifying and rectifying faults in software programs has garnered attention in the tech community.

Latest Patents

Shin Hwei Tan holds a patent for a software program repair system. This patent outlines a method for locating faults in a software program using a test suite. The system is designed to modify the software program in response to identified faults, utilizing a repair template. Furthermore, it includes mechanisms to determine whether the modifications meet specific anti-pattern conditions, ensuring that any changes made do not introduce new issues.

Career Highlights

Shin Hwei Tan is currently employed at Fujitsu Limited, where he continues to develop innovative solutions in software technology. His work focuses on enhancing the reliability and efficiency of software systems, making significant strides in the industry.

Collaborations

Shin has collaborated with notable colleagues, including Hiroaki Yoshida and Mukul Ranjan Prasad. Their combined expertise contributes to the advancement of technology and innovation within their field.

Conclusion

Shin Hwei Tan's contributions to software program repair exemplify the importance of innovation in technology. His patent and ongoing work at Fujitsu Limited highlight his commitment to improving software reliability and performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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